Book a Demo

Self-Referenced Spectrometer

Abstract:

Aspects of the disclosure relate to a self-referenced spectrometer for providing simultaneous measurement of a background or reference spectral density and a sample or other spectral density. The self-referenced spectrometer includes an interferometer optically coupled to receive an input beam and to direct the input beam along a first optical path to produce a first interfering beam and a second optical path to produce a second interfering beam, where each interfering beam is produced prior to an output of the interferometer. The spectrometer further includes a detector optically coupled to simultaneously detect a first interference signal produced from the first interfering beam and a second interference signal produced from the second interfering beam, and a processor configured to process the first interference signal and the second interference signal and to utilize the second interference signal as a reference signal in processing the first interference signal.

Images

US20190301939A1

united states
download pdf
inventor: 
Mostafa Medhat, Bassem Mortada, Yasser Sabry, Mohamed Hossam, Momen Anwar, Ahmed Shebl, Hisham Haddara, Bassam A. Saadany
current assignee: 
SI Ware Systems Inc
Status: 
Allowed
Status Date: 
August 10, 2021
domain: 
SI Ware Systems Inc
worldwide applications: 
2015 . us us . 2026 . kr au ca wo es ep cn mx jp . 2017 . us us 2018 . il

Ready to Streamline analysis processes for your business ?

See NeoSpectra in action and learn how it can enhance your analysis workflows. Complete the form to request a demo and we’ll be glad to guide you through its unique features.

Contact us